Reflectance Properties of Silver Thin Film Synthesized via RF Magnetron Sputtering

Abstract

Nano film materials have now become one of the most interesting areas for research explorations and technological applications due to its unique properties that varied significantly when deposited in different conditions. One of the leading materials with very interesting use in photovoltaic devices, electrochemical applications, optical coatings, and medical applications is silver (Ag). Thus, this study is carried out to investigate the reflectance property of silver nano film. The films are synthesized in a silicon (Si) wafer substrate using radio frequency magnetron sputtering device deposited under 300 °C and 500 °C substrate temperature. The X-ray diffraction (XRD) result revealed the existence of silver crystals in all samples. UV-vis spectrophotometer was used to analyze the optical properties of the silver nano film sample. Correspondingly, the grown silver nano film at 500 °C has a solar reflectance (R_sol) of 65.16%, which indicates the sample’s remarkable ability to reflect solar energy.  Additionally, the sample’s reflectance in the ultraviolet (R_UV), visible (R_lum), and infrared (R_IR) spectra are 61.35%, 75.53%, and 49.48 %, respectively. These results indicate that the prepared sample has better reflectance properties compared to the Ag film synthesized 300 °C substrate temperature.